GB/T 14145-1993

Test method for stacking fault density of epitaxial layers of silicon by interference-contrast microscopy

NORMA vydaná dňa 6.2.1993

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The information about the standard:

Designation standards: GB/T 14145-1993
Note: NEPLATNÁ
Publication date standards: 6.2.1993
Country: Chinese technical standard
Kategória: Technické normy GB