E DIN IEC 60749-35:2004-12

Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for non-hermetic encapsulated electronic components.

NORMA vydaná dňa 1.12.2004

The information about the standard:

Designation standards: E DIN IEC 60749-35:2004-12
Note: NEPLATNÁ
Publication date standards: 1.12.2004
The number of pages: 34
Approximate weight : 102 g (0.22 lbs)
Country: German technical standard
Kategória: Technické normy DIN