E DIN IEC 60749-23:2002-10

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life.

NORMA vydaná dňa 1.10.2002

The information about the standard:

Designation standards: E DIN IEC 60749-23:2002-10
Note: NEPLATNÁ
Publication date standards: 1.10.2002
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: German technical standard
Kategória: Technické normy DIN