E DIN EN IEC 60749-23:2025-10

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life.

NORMA vydaná dňa 1.10.2025

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The information about the standard:

Designation standards: E DIN EN IEC 60749-23:2025-10
Publication date standards: 1.10.2025
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: German technical standard
Kategória: Technické normy DIN

Annotation of standard text E DIN EN IEC 60749-23:2025-10 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 23: Lebensdauer bei hoher Temperatur.