E DIN EN 60749-23/A1:2009-09

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life.

NORMA vydaná dňa 1.9.2009

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The information about the standard:

Designation standards: E DIN EN 60749-23/A1:2009-09
Note: NEPLATNÁ
Publication date standards: 1.9.2009
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: German technical standard
Kategória: Technické normy DIN

Annotation of standard text E DIN EN 60749-23/A1:2009-09 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 23: Lebensdauer bei hoher Temperatur.