DIN EN 60749-23:2004-10

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life.

NORMA vydaná dňa 1.10.2004

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The information about the standard:

Designation standards: DIN EN 60749-23:2004-10
Note: NEPLATNÁ
Publication date standards: 1.10.2004
The number of pages: 11
Approximate weight : 33 g (0.07 lbs)
Country: German technical standard
Kategória: Technické normy DIN

Annotation of standard text DIN EN 60749-23:2004-10 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 23: Lebensdauer bei hoher Temperatur.