
Semiconductor devices - Mechanical and climatic test methods.
NORMA vydaná dňa 1.2.2000
Designation standards: DIN EN 60749:2000-02
Note: NEPLATNÁ
Publication date standards: 1.2.2000
The number of pages: 30
Approximate weight : 90 g (0.20 lbs)
Country: German technical standard
Kategória: Technické normy DIN
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren.