BS ISO 14706:2014

Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy.

NORMA vydaná dňa 31.7.2014

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The information about the standard:

Designation standards: BS ISO 14706:2014
Publication date standards: 31.7.2014
The number of pages: 36
Approximate weight : 108 g (0.24 lbs)
Country: British technical standard
Kategória: Technické normy BS

Annotation of standard text BS ISO 14706:2014 :

ISBN: 978 0 580 82725 9 Status: Under Review