
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors.
NORMA vydaná dňa 11.11.2022
Designation standards: BS IEC 63284:2022
Publication date standards: 11.11.2022
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: British technical standard
Kategória: Technické normy BS
ISBN: 978 0 539 12643 3 Status: Definitive