BS IEC 63275-1:2022

Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors. Test method for bias temperature instability.

NORMA vydaná dňa 5.10.2022

The information about the standard:

Designation standards: BS IEC 63275-1:2022
Publication date standards: 5.10.2022
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: British technical standard
Kategória: Technické normy BS