BS IEC 62047-31:2019

Semiconductor devices. Micro-electromechanical devices. Four-point bending test method for interfacial adhesion energy of layered MEMS materials.

NORMA vydaná dňa 17.4.2019

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The information about the standard:

Designation standards: BS IEC 62047-31:2019
Publication date standards: 17.4.2019
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: British technical standard
Kategória: Technické normy BS

Annotation of standard text BS IEC 62047-31:2019 :

ISBN: 978 0 580 96660 6 Status: Definitive