
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET).
NORMA vydaná dňa 29.9.2006
Designation standards: BS EN 62373:2006
Publication date standards: 29.9.2006
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: British technical standard
Kategória: Technické normy BS
ISBN: 0 580 49255 9 Status: Definitive