Test Method for Determining Carrier Density in Silicon Epitaxial Layers by Capacitance-Voltage Measurements on Fabricated Junction or Schottky Diodes (Withdrawn 2001)
NORMA vydaná dňa 1.1.1994
Označenie normy: ASTM F419-94
Poznámka: NEPLATNÁ
Dátum vydania normy: 1.1.1994
Počet strán: 11
Približná hmotnosť: 33 g (0.07 libier)
Krajina: Americká technická norma
Kategória: Technické normy ASTM
Keywords:
Capacitance-voltage method, Carrier density (in semiconductors), Density-electronic applications, Dielectric breakdown/strength-semiconductor materials, Diodes, Epitaxial wafer, Gate bias, Inhomogeneities, Junction diode, Net carrier density (in semiconductors), Polished silicon wafers/slices, Resistance and resistivity, Schottky diode, Silicon semiconductors, Single-crystal silicon, Voltage, carrier density-silicon epitaxial layers, by capacitance-voltage