Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Resolution Glow Discharge Mass Spectrometer
NORMA vydaná dňa 15.6.2008
Označenie normy: ASTM F1845-08
Poznámka: NEPLATNÁ
Dátum vydania normy: 15.6.2008
Počet strán: 4
Približná hmotnosť: 12 g (0.03 libier)
Krajina: Americká technická norma
Kategória: Technické normy ASTM
Keywords:
aluminum, aluminum-copper alloys, aluminum-copper-silicon alloys, aluminum-silicon alloys, electronics, glow discharge mass spectrometer (GDMS), purity analysis, sputtering target, trace metallic impurities, Impurities--electronic materials/applications, Mass spectrometry--electronic materials/applications, Trace metallic impurities, Aluminum alloys (electronic), Aluminum electrical conductors (semiconductors), Electronic-grade metals, Glow discharge mass spectrometer (GDMS)