ASTM F1192-11(2018)

Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

NORMA vydaná dňa 1.3.2018

Anglicky -
PDF - okamžité stiahnutie (64.70 EUR)

Anglicky -

Tlačené (64.70 EUR)

The information about the standard:

Designation standards: ASTM F1192-11(2018)
Publication date standards: 1.3.2018
The number of pages: 11
Approximate weight : 33 g (0.07 lbs)
Country: American technical standard
Kategória: Technické normy ASTM

Annotation of standard text ASTM F1192-11(2018) :

Keywords:
SEB, SEE, SEFI, SEGR, SEL, SEP, SEP cross section, SEU, single event, single event effect, single event phenomena, single event upset, space environment,, ICS Number Code 31.080.01 (Semi-conductor devices in general)