ASTM F980-10e1

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices (Includes all amendments And changes 2/2/2017).

NORMA vydaná dňa 1.12.2010

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The information about the standard:

Designation standards: ASTM F980-10e1
Note: NEPLATNÁ
Publication date standards: 1.12.2010
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: American technical standard
Kategória: Technické normy ASTM

Annotation of standard text ASTM F980-10e1 :

Keywords:
annealing factor, annealing function, displacement damage, integrated circuits, neutron damage, neutron degradation, photoconducting device, rapid annealing, semiconductor devices ,, ICS Number Code 29.045 (Semiconducting materials)