Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

The information about the standard:

Designation standards: ASTM F980-10
Note: NEPLATNÁ
Publication date standards: 10.6.1996
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Kategória: Technické normy ASTM

Annotation of standard text ASTM F980-10 :

Keywords:
annealing factor, annealing function, displacement damage, integrated circuits, neutron damage, neutron degradation, photoconducting device, rapid annealing, semiconductor devices, Annealing, Defects--semiconductors, Destructive testing--semiconductors, Displacement--electronic materials/applications, Electrical conductors (semiconductors), Electronic hardness, Integrated circuits, Neutron radiation, Pulsed neutron-radiation source, Radiation exposure--electronic components/devices