Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits
NORMA vydaná dňa 1.1.1997
Označenie normy: ASTM F744M-97
Poznámka: NEPLATNÁ
Dátum vydania normy: 1.1.1997
Počet strán: 6
Približná hmotnosť: 18 g (0.04 libier)
Krajina: Americká technická norma
Kategória: Technické normy ASTM
Keywords:
Circuitry, Current measurement-semiconductors, Destructive testing-semiconductors, Dose rate threshold, Dosimetry, Electrical conductors-semiconductors, Electron linear accelerator, Flash x-ray machines (FXR), Integrated circuits, Irradiance/irradiation-semiconductors, Lasers and laser applications, Linear threshold voltage, Radiation exposure-electronic components/devices, Upset threshold, Voltage, radiation dose rate threshold for determining upset threshold of digital