Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]
NORMA vydaná dňa 1.5.2010
Označenie normy: ASTM F744M-10
Poznámka: NEPLATNÁ
Dátum vydania normy: 1.5.2010
Počet strán: 7
Približná hmotnosť: 21 g (0.05 libier)
Krajina: Americká technická norma
Kategória: Technické normy ASTM
Keywords:
DIC, digital integrated circuits, dose rate, ionizing radiation, radiation dose rate, threshold for upset, upset, Circuitry, Current measurement--semiconductors, Destructive testing--semiconductors, Dose rate threshold, Dosimetry, Electrical conductors (semiconductors), Electron linear accelerator, Flash X-ray machines (FXR), Irradiance/irradiation--semiconductors, Lasers and laser applications, Linear threshold voltage, Radiation exposure--electronic components/devices, Upset threshold, Voltage