Test Method for Crystalographic Perfection of Silicon by Preferential Etch Techniques (Withdrawn 1998)
Designation standards: ASTM F47-94
Note: NEPLATNÁ
The number of pages: 11
Approximate weight : 33 g (0.07 lbs)
Country: American technical standard
Kategória: Technické normy ASTM
Keywords:
ICS Number Code 77.040.30 (Chemical analysis of metals)