Standard Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum (Withdrawn 2003)
NORMA vydaná dňa 15.5.1992
Designation standards: ASTM F398-92(2002)
Note: NEPLATNÁ
Publication date standards: 15.5.1992
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: American technical standard
Kategória: Technické normy ASTM
Keywords:
gallium arsenide, germanium, infrared reflectance, majority carrier concentration, plasma resonance, semiconductors, silicon, ICS Number Code 29.045 (Semiconducting materials)