Standard Test Methods for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage (Withdrawn 2003)
NORMA vydaná dňa 10.12.2002
Designation standards: ASTM F391-02
Note: NEPLATNÁ
Publication date standards: 10.12.2002
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: American technical standard
Kategória: Technické normy ASTM
Keywords:
diffusion length, minority carriers, polysilicon, silicon, single crystal silicon, surface photovoltag, ICS Number Code 29.045 (Semiconducting materials)