ASTM F26-87a(1999)

Standard Test Methods for Determining the Orientation of a Semiconductive Single Crystal (Withdrawn 2003) (Includes all amendments And changes 3/2/2021).

NORMA vydaná dňa 1.1.1999

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The information about the standard:

Designation standards: ASTM F26-87a(1999)
Note: NEPLATNÁ
Publication date standards: 1.1.1999
The number of pages: 5
Approximate weight : 15 g (0.03 lbs)
Country: American technical standard
Kategória: Technické normy ASTM

Annotation of standard text ASTM F26-87a(1999) :

Keywords:
germanium, orientation, preferential etch, semiconductor, silicon, X-ray diffraction, ICS Number Code 29.045 (Semiconducting materials)