ASTM F1809-97

Standard Guide for Selection and Use of Etching Solutions to Delineate Structural Defects in Silicon

NORMA vydaná dňa 10.6.1997

Anglicky -
PDF - okamžité stiahnutie (70.70 EUR)

The information about the standard:

Designation standards: ASTM F1809-97
Note: NEPLATNÁ
Publication date standards: 10.6.1997
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: American technical standard
Kategória: Technické normy ASTM

Annotation of standard text ASTM F1809-97 :

Keywords:
defect density, dislocation, grain boundary, microscopic, polycrystalline, imperfection, preferential etch, silicon, slip, ICS Number Code 29.045 (Semiconducting materials)