ASTM F1809-02

Standard Guide for Selection and Use of Etching Solutions to Delineate Structural Defects in Silicon (Withdrawn 2003)

NORMA vydaná dňa 10.12.2002

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The information about the standard:

Designation standards: ASTM F1809-02
Note: NEPLATNÁ
Publication date standards: 10.12.2002
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: American technical standard
Kategória: Technické normy ASTM

Annotation of standard text ASTM F1809-02 :

Keywords:
defect density, dislocation, grain boundary, microscopic, polycrystalline, imperfection, preferential etch, silicon, slip, ICS Number Code 29.045 (Semiconducting materials)