ASTM F1726-97

Standard Guide for Analyis of Crystallographic Perfection of Silicon Wafers

NORMA vydaná dňa 10.6.1997

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The information about the standard:

Designation standards: ASTM F1726-97
Note: NEPLATNÁ
Publication date standards: 10.6.1997
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: American technical standard
Kategória: Technické normy ASTM

Annotation of standard text ASTM F1726-97 :

Keywords:
dislocation, epitaxy, grain boundaries, hillock, polycrystalline imperfections, preferential etch, shallow pit, silicon, slip, stacking fault, ICS Number Code 29.045 (Semiconducting materials)