Standard Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with p-Polarized Radiation Incident at the Brewster Angle (Withdrawn 2003) (Includes all amendments And changes 8/16/2017).
NORMA vydaná dňa 15.9.1995
Označenie normy: ASTM F1619-95(2000)e1
Poznámka: NEPLATNÁ
Dátum vydania normy: 15.9.1995
Počet strán: 7
Približná hmotnosť: 21 g (0.05 libier)
Krajina: Americká technická norma
Kategória: Technické normy ASTM
Keywords:
Brewster angle, infrared absorption, interstitial oxygen, oxygen, silicon, ICS Number Code 29.045 (Semiconducting materials)