Standard Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with p-Polarized Radiation Incident at the Brewster Angle (Withdrawn 2003) (Includes all amendments And changes 8/16/2017).
NORMA vydaná dňa 15.9.1995
Designation standards: ASTM F1619-95(2000)e1
Note: NEPLATNÁ
Publication date standards: 15.9.1995
The number of pages: 7
Approximate weight : 21 g (0.05 lbs)
Country: American technical standard
Kategória: Technické normy ASTM
Keywords:
Brewster angle, infrared absorption, interstitial oxygen, oxygen, silicon, ICS Number Code 29.045 (Semiconducting materials)