Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits (Includes all amendments And changes 10/20/2011).
NORMA vydaná dňa 1.1.2005
Označenie normy: ASTM F1467-99(2005)e1
Poznámka: NEPLATNÁ
Dátum vydania normy: 1.1.2005
Počet strán: 18
Približná hmotnosť: 54 g (0.12 libier)
Krajina: Americká technická norma
Kategória: Technické normy ASTM
Keywords:
ionizing radiation effects, microcircuits, radiation hardness, semiconductor devices, X-ray testing, Electronic hardness, Collimator/collimation, Electrical conductors (semiconductors), Experimental design/evaluation, Ionizing radiation, Low-energy radiation, Microcircuits, Microelectronic devices, Radiation exposure--electronic components/devices, Radiation-hardness testing, Semiconductor device testing, X-ray testing, ICS Number Code 31.020 (Electronic components in general)