Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
NORMA vydaná dňa 10.1.1999
Označenie normy: ASTM F1467-99
Poznámka: NEPLATNÁ
Dátum vydania normy: 10.1.1999
Počet strán: 17
Približná hmotnosť: 51 g (0.11 libier)
Krajina: Americká technická norma
Kategória: Technické normy ASTM
Keywords:
Collimator, Electrical conductors-semiconductors, Electronic hardness, Experimental design, Hardness tests-radiation (of semiconductors), Ionizing radiation, Low energy ([aprox] 10 keV photons) X-ray sources, Microcircuits, Microelectronic device processing, Radiation effects testing, Radiation exposure-electronic components/devices, Radiation-hardness testing, Semiconductor device testing, X-ray testing, X-ray tester ([aprox] 10 keV photons)-ionizing radiation effects testing