Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
NORMA vydaná dňa 1.6.2011
Označenie normy: ASTM F1263-11
Poznámka: NEPLATNÁ
Dátum vydania normy: 1.6.2011
Počet strán: 3
Približná hmotnosť: 9 g (0.02 libier)
Krajina: Americká technická norma
Kategória: Technické normy ASTM
Keywords:
confidence, rejection, overtest data, statistical analysis, Acceptance criteria/testing, Data analysis, Electrical conductors (semiconductors), Estimated survival probability, Failure end point--electronic components/devices, Microelectronic devices, Overtest data, Probability of survival, Quality assurance (QA), Stress--electronic components/device, ICS Number Code 31.020 (Electronic components in general)