ASTM F1192-00(2006)

Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

NORMA vydaná dňa 1.7.2006

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The information about the standard:

Designation standards: ASTM F1192-00(2006)
Note: NEPLATNÁ
Publication date standards: 1.7.2006
The number of pages: 11
Approximate weight : 33 g (0.07 lbs)
Country: American technical standard
Kategória: Technické normy ASTM

Annotation of standard text ASTM F1192-00(2006) :

Keywords:
SEB, SEE, SEFI, SEGR, SEL, SEP, SEP cross section, SEU, single event, single event effect, single event phenomena, single event upset, space environment, ICS Number Code 31.080.01 (Semi-conductor devices in general)