ASTM E1634-26

Standard Guide for Performing Sputter Crater Depth Measurements

NORMA vydaná dňa 1.10.2026

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The information about the standard:

Designation standards: ASTM E1634-26
Publication date standards: 1.10.2026
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: American technical standard
Kategória: Technické normy ASTM

Annotation of standard text ASTM E1634-26 :

Keywords:
Auger electron spectroscopy, secondary ion mass spectrometry, stylus profilometry, surface analysis , X-ray photoelectron spectroscopy,, ICS Number Code 71.040.50 (Physicochemical methods of analysis)