Standard Practice for Radiologic Examination of Semiconductors and Electronic Components
NORMA vydaná dňa 1.6.2009
Označenie normy: ASTM E1161-09
Poznámka: NEPLATNÁ
Dátum vydania normy: 1.6.2009
Počet strán: 10
Približná hmotnosť: 30 g (0.07 libier)
Krajina: Americká technická norma
Kategória: Technické normy ASTM
Keywords:
capacitor, diode, electronic device, hybrid, inductor, microcircuits, microcircuit array, monolithic, multichip, nondestructive testing, radiographic, radiologic, radiology, radioscopy, rectifier, relay, resistor, semiconductor, switches, transformer, transistor, tunnel diode, voltage regulator, x-ray, Defects--semiconductors, Electrical conductors (semiconductors), Electronic materials/applications, Radiographic examination, Sealing glass defects, Voids, X-irradiation