Standard Practice for Radiologic Examination of Semiconductors and Electronic Components

The information about the standard:

Designation standards: ASTM E1161-09
Note: NEPLATNÁ
Publication date standards: 1.6.2009
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: American technical standard
Kategória: Technické normy ASTM

Annotation of standard text ASTM E1161-09 :

Keywords:
capacitor, diode, electronic device, hybrid, inductor, microcircuits, microcircuit array, monolithic, multichip, nondestructive testing, radiographic, radiologic, radiology, radioscopy, rectifier, relay, resistor, semiconductor, switches, transformer, transistor, tunnel diode, voltage regulator, x-ray, Defects--semiconductors, Electrical conductors (semiconductors), Electronic materials/applications, Radiographic examination, Sealing glass defects, Voids, X-irradiation