Standard Test Method for Determining the Effective Elastic Parameter for X-Ray Diffraction Measurements of Residual Stress (Includes all amendments And changes 2/27/2015).
NORMA vydaná dňa 1.6.2009
Označenie normy: ASTM E1426-98(2009)e1
Poznámka: NEPLATNÁ
Dátum vydania normy: 1.6.2009
Počet strán: 5
Približná hmotnosť: 15 g (0.03 libier)
Krajina: Americká technická norma
Kategória: Technické normy ASTM
Keywords:
elastic parameter, residual stress, x-ray diffraction, Crystal lattice structure, Effective elastic parameter (Eeff), Macroscopic analysis, Polycrystalline materials, Residual stress, Stress--metallic materials, X-ray diffraction analysis, ICS Number Code 71.040.50 (Physicochemical methods of analysis)