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ASTM F77-69(1996)
Test Method for Apparent Density of Ceramics for Electron Device and Semiconductor Application (Withdrawn 2001)
Automaticky preložený názov:
Skúšobná metóda pre hustote keramiky pre elektrónovú zariadenia a aplikácie Semiconductor ( Withdrawn 2001 )
NORMA vydaná dňa 1.1.1996
Informácie o norme:
Označenie normy: ASTM F77-69(1996)
Poznámka: NEPLATNÁ
Dátum vydania normy: 1.1.1996
Kód tovaru: NS-56390
Počet strán: 2
Približná hmotnosť: 6 g (0.01 libier)
Krajina: Americká technická norma
Kategória: Technické normy ASTM
Anotácia textu normy ASTM F77-69(1996) :
Keywords:
Ceramic materials-electrical/electronic devices, Density-electronic applications, Electronic materials/applications-ceramics, apparent density of ceramics (for electron device/semiconductor, application), ICS Number Code 29.045 (Semiconducting materials), 81.060.20 (Ceramic products)
Doplňujúce informácie
| 1. Scope |
|
1.1 This test method covers the determination of the apparent density of ceramic parts, used in electron device and semiconductor applications, with a maximum dimension of 25 mm (1 in.) and having zero or discontinuous porosity. 1.2 The values stated in SI units are to be regarded as the standard. The values in parentheses are for information only. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability or regulatory limitations prior to use. |
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